Computer Architecture, C, Teradyne, Silicon Validation, Functional Testing, Loopback, Python, MBIST, Scan, Advantest, Analog Mixed Signal design, Dft, Ate, ASIC Design, DRAM concepts, APG Algorithmic Pattern Generator

Python, Reliability Test Flow Development, Cross-Functional Collaboration, DPM reduction, Risk Management, Jmp, Statistics and Data Analysis, Reliability Test Plan and Execution, Project Management, Root Cause and Resolution of Qual and RMA Device Issues, Process Conversions, Electrical and Electronics Engineering, Technical Decision Making