occ, Memory-BIST, DFT architecture scan Insertion compression at core level and SoC level, SSN architecture, timing and no-timing simulations, clock architecture, ATPG pattern generation coverage analysis

Non-volatile Memory (Flash, Dft, MRAM, MBIST, ReRAM, Synopsys, iJTAG IEEE 1687, SoC MCU Architecture, TestMAX, Functional Safety, power management, JTAG IEEE 1149.1, ATPG, Scan Compression, Mentor, Tessent, Audio, Rf, Mixed-signal Design, LBIST, Ate, Digital Design Flows